LEONA™ Halogen-Free Polyamide with High CTI and Long-Term Heat Resistance (Under Development)
​

As electrical components continue to move toward higher voltages and increased miniaturization, resin materials are increasingly required to achieve both long-term heat resistance and electrical reliability.

In general, halogen-based heat stabilizers are often used to ensure the long-term heat resistance and thermal stability of polyamides. However, such additives can pose challenges from the perspectives of tracking resistance and ion migration risk.

This LEONA™ development grade achieves both long-term heat resistance and high CTI without the use of 
​halogen-based heat stabilizers.​
With excellent aging resistance and ion migration resistance, it contributes
 to improved electrical reliability and enhanced long-term safety in electrical and electronic applications.

Key Features

• No halogen-based heat stabilizers
• Combination of heat aging resistance and tracking resistance (CTI > 600 V)
• Material design that does not adversely affect electronic control components (Electrical friendly)

①    Heat Aging Resistance

This development grade of LEONA™ demonstrates excellent heat aging resistance despite being halogen-free.​
In general, halogen-based heat stabilizers are often considered to ensure long-term heat resistance in polyamides; however, such additives can involve trade-offs in terms of electrical properties and reliability.

Grade		LEONA™ Development Grade	LEONA™ 1300G (Conventional)	LEONA™ 14G35 (Conventional)
Feature		Heat-resistant & high CTI	Heat stabilizer added	Halogen-based stabilizer
Composition		PA66＋GF35%	PA66＋GF33%	PA66＋GF35%
Long-term heat resistance 3000hr hot-air aging Tensile stress retention	120℃ (++ = >85%)	++	+	++
	150℃ (++ = >70%)	++	+	++
Tracking resistance [CTI] (IEC)	Material Group	I	I	II
	CTI Value	600V	600V	500V
Ion migration		Not observed	Not observed	Observed
Metal Corrosion Resistance		Good	Good	Corrosion
Low ion leachability		Good	Good	Leaching

 

Comparison of Key Properties of LEONA™ Development Grades

 

By optimizing the material formulation, this grade has been confirmed to maintain high tensile strength even after 3,000 hours of high-temperature aging.
This suppression of property degradation under long-term use conditions enables a strong balance between thermal stability and long-term reliability, both of which are critical requirements for electrical and electronic components.

②    Ion Migration Resistance

Under high-voltage conditions, halogen ions can cause metal ion dissolution and migration at electrodes (ion migration), increasing the risk of short circuits and failures.
In particular, it is well known that halogen-containing materials are more prone to metal ion deposition and dendrite formation.

→What is ion migration? (Click here for details)

For this development grade, evaluations conducted under severe conditions (85°C / 85% RH / 800 V / 500 hours) confirmed no occurrence of ion migration.

No deposits were observed between electrodes. As a result, this material contributes as an electrically safe and reliable (“Electrical friendly”) solution for electrical applications used in high-voltage environments.

* “Halogen-free” on this page indicates that iodine (I), bromine (Br), and chlorine (Cl) are not intentionally added.

This development grade represents a new LEONA™ solution that successfully balances long-term heat resistance, high CTI, and ion migration resistance within the constraints of a halogen-free design.
In electrical applications where higher voltages and longer service life are increasingly required, it helps reduce material-related electrical failure risks while improving both design flexibility and overall reliability.

For feasibility studies, detailed evaluation data, or potential applications, please feel free to contact us.